Patent Assignment
Reel/Frame 015561/0195
Assignment of Assignor's Interest
Recorded: 2005-01-07
Pages: 3
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Methods of Testing Semiconductor Memory Devices in a Variable Cas Latency Environment and Related Semiconductor Test Devices