Patent Assignment
Reel/Frame 015673/0291
Assignment of Assignor's Interest
Recorded: 2004-03-10
Pages: 3
Assignors
KIM, YEONG RYEOL
Executed: 2004-03-02
PARK, JI JONG
Executed: 2004-03-02
KIM, JIN YONG
Executed: 2004-03-02
LEE, JOONG WHAN
Executed: 2004-03-02
Assignee
KMAC
104-11 MUNJI-DONG, YUSONG-GU, DAEJEON-CITY, KOREA, REPUBLIC OF
Covered Property
(1)
Apparatus for Measuring Characteristics of Thin Film by Means of Two-Dimensional Detector and Method of Measuring the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.