Patent Assignment
Reel/Frame 015678/0933
Assignment of Assignor's Interest
Recorded: 2004-08-10
Pages: 2
Assignors
HYUN, PIL-SIK
Executed: 2004-07-23
KANG, SUN-JIN
Executed: 2004-07-29
LEE, SANG-KIL
Executed: 2004-07-26
JUNG, KYUNG-HO
Executed: 2004-07-26
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Apparatus and Method for Measuring Each Thickness of a Multilayer Stacked on a Substrate