Patent Assignment
Reel/Frame 015684/0396
Assignment of Assignor's Interest
Recorded: 2004-08-16
Pages: 2
Assignors
YOSHIDA, MINORU
Executed: 2004-02-25
MAEDA, SHUNJI
Executed: 2004-02-25
NISHIYAMA, HIDETOSHI
Executed: 2004-02-25
WATANABE, MASAHIRO
Executed: 2004-02-26
Assignee
HITACHI-HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Pattern Defect Inspection Method and Its Apparatus