Patent Assignment
Reel/Frame 015744/0349
Assignment of Assignor's Interest
Recorded: 2004-08-30
Pages: 3
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO 105-8001, JAPAN
Covered Property
(1)
Semiconductor Device with Memory and Method for Memory Test