IP Library › Assignment 015818/0182
Patent Assignment
Reel/Frame 015818/0182

Assignment of Assignor's Interest

Recorded: 2004-09-27 Pages: 3
Assignors
MATSUYA, MIYUKI
Executed: 2004-08-12
UNO, SHINOBU
Executed: 2004-08-12
Assignee
JEOL LTD.
1-2, MUSASHINO 3-CHOME, AKISHIMA, TOKYO 196-8558, JAPAN
Covered Property (1)
Charged-Particle Beam Instrument and Method of Correcting Aberration Therein
Patent: 6,930,312 →
Application: 10/861,775 →
Publication: US 2005/0017194