IP Library › Assignment 015840/0857
Patent Assignment
Reel/Frame 015840/0857

Assignment of Assignor's Interest

Recorded: 2004-10-01 Pages: 2
Assignor
Assignee
ASML NETHERLANDS B.V.
DE RUN 6501, 5504 DR, VELDHOVEN, NETHERLANDS
Covered Properties (2)
Method of Measuring Overlay
Patent: 6,937,344 →
Application: 09/940,818 →
Publication: US 2002/0080364
Method of Measuring Alignment of a Substrate with Respect to a Reference Alignment Mark
Patent: 6,937,334 →
Application: 09/940,819 →
Publication: US 2002/0080365
Related Assignments (2)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 28, 2001
From: MONSHOUWER, RENE; NEIJZEN, JACOBUS HERMANUS MARIA; VAN DER WERF, JAN EVERT
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 012140/0620 →
Assignment of Assignor's Interest Aug 28, 2001
From: MONSHOUWER, RENE; NEIJZEN, JACOBUS HERMANUS MARIA; VAN DER WERF, JAN EVERT
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 012141/0799 →