Patent Assignment
Reel/Frame 015845/0406
Assignment of Assignor's Interest
Recorded: 2004-10-04
Pages: 4
Assignors
ZHAO, YAN
Executed: 2004-08-27
YEH, CHANG-CHUN
Executed: 2004-09-26
CHEN, ZHONG-WEI
Executed: 2004-09-29
JAU, JACK
Executed: 2004-09-23
Assignee
HERMES-MICROVISION (TAIWAN) INC.
18 CREATIN ROAD 1, SCIENCE BASED INDUSTRIAL PARK, HSINCHU, 300, TAIWAN
Covered Property
(1)
Method for in-Line Monitoring of via/Contact Holes Etch Process Based on Test Structures in Semiconductor Wafer Manufacturing
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.