IP Library › Assignment 015946/0646
Patent Assignment
Reel/Frame 015946/0646

Assignment of Assignor's Interest

Recorded: 2004-08-25 Pages: 3
Assignors
NABATOVA-GABAIN, NATALIYA
Executed: 2004-03-03
WASAI, YOKO
Executed: 2004-03-03
Assignee
HORIBA, LTD.
2 MIYANOHIGASHI-MACHI, KISSHOIN, MINAMI-KU, KYOTO-SHI, KYOTO, 601-8510, JAPAN
Covered Property (1)
Method for Analyzing Thin-Film Layer Structure Using Spectroscopic Ellipsometer
Patent: 7,196,793 →
Application: 10/488,596 →
Publication: US 2004/0265477