Patent Assignment
Reel/Frame 015948/0819
Assignment of Assignor's Interest
Recorded: 2004-11-03
Pages: 3
Assignors
WATANABE, HIROSHI
Executed: 2004-10-27
IDEDA, TATSUJI
Executed: 2004-10-28
TAKAHASHI, KAZUYA
Executed: 2004-10-28
Assignee
CANON KABUSHIKI KAISHA
3-30-2, SHIMOMARUKO, OHTA-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Testing Device and Method