Patent Assignment
Reel/Frame 015954/0720
Assignment of Assignor's Interest
Recorded: 2004-11-05
Pages: 4
Assignors
HASEGAWA, TSUYOSHI
Executed: 2004-09-27
AONO, MASAKAZU
Executed: 2004-09-27
NAKAYAMA, TOMONOBU
Executed: 2004-09-27
HOSAKA, SUMIO
Executed: 2004-09-27
Assignee
RIKEN
2-1, HIROSAWA, WAKO-SHI, SAITAMA, 351-1098, JAPAN
Covered Property
(1)
Scanning Probe Microscope and Specimen Surface Structure Measuring Method