IP Library Assignment 015959/0404
Patent Assignment
Reel/Frame 015959/0404

Assignment of Assignor's Interest

Recorded: 2005-03-24 Pages: 3
Assignor
SAKAI, HIROSHI
Executed: 2005-02-14
Assignee
SANKYO SEIKI MFG. CO., LTD.
5329 SHIMOSUWA-MACHI, SUWA-GUN, NAGANO-KEN 393, JAPAN
Covered Property (1)
Method of Analyzing Astigmatic Difference and Method of Correcting the Spot Diameters for an Optical Device and Spot Analysis System
Patent: 7,175,087 →
Application: 11/013,550 →
Publication: US 2005/0156044
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 21, 2006
From: SANKYO SEIKI MFG. CO., LTD.
To: NIDEC SANKYO CORPORATION
Reel/Frame 018541/0955 →
Assignment of Assignor's Interest Jan 12, 2010
From: NIDEC SANKYO CORPORATION
To: VOXPATH RS LLC
Reel/Frame 023758/0563 →
Assignment of Assignor's Interest Jun 26, 2015
From: VOXPATH NETWORKS, LLC
To: MFI TECHNOLOGY, LLC
Reel/Frame 036020/0027 →
Assignment of Assignor's Interest Aug 14, 2015
From: VOXPATH NETWORKS, LLC
To: MFI TECHNOLOGY, LLC
Reel/Frame 036820/0205 →
Assignment of Assignor's Interest Mar 27, 2017
From: MFI TECHNOLOGY, LLC
To: DIMENSIONAL DYNAMICS, LLC
Reel/Frame 041753/0932 →