Patent Assignment
Reel/Frame 018541/0955
Change of Name
Recorded: 2006-11-21
Pages: 6
Assignor
SANKYO SEIKI MFG. CO., LTD.
Executed: 2005-10-03
Assignee
NIDEC SANKYO CORPORATION
5329 SHIMOSUWA-MACHI, SUWA-GUN, NAGANO, 393-8511, JAPAN
Covered Property
(1)
Method of Analyzing Astigmatic Difference and Method of Correcting the Spot Diameters for an Optical Device and Spot Analysis System
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 24, 2005
From: SAKAI, HIROSHI
To: SANKYO SEIKI MFG. CO., LTD.
Reel/Frame 015959/0404 →
Assignment of Assignor's Interest
Jan 12, 2010
From: NIDEC SANKYO CORPORATION
To: VOXPATH RS LLC
Reel/Frame 023758/0563 →
Assignment of Assignor's Interest
Jun 26, 2015
From: VOXPATH NETWORKS, LLC
To: MFI TECHNOLOGY, LLC
Reel/Frame 036020/0027 →
Assignment of Assignor's Interest
Aug 14, 2015
From: VOXPATH NETWORKS, LLC
To: MFI TECHNOLOGY, LLC
Reel/Frame 036820/0205 →
Assignment of Assignor's Interest
Mar 27, 2017
From: MFI TECHNOLOGY, LLC
To: DIMENSIONAL DYNAMICS, LLC
Reel/Frame 041753/0932 →