IP Library Assignment 015977/0656
Patent Assignment
Reel/Frame 015977/0656

Assignment of Assignor's Interest

Recorded: 2004-11-12 Pages: 3
Assignors
KODAMA, TOSHIO
Executed: 2004-11-05
HASUDA, MASAKATSU
Executed: 2004-11-05
FUJII, TOSHIAKI
Executed: 2004-11-05
IWASAKI, KOUJI
Executed: 2004-11-05
SUGIYAMA, YASUHIKO
Executed: 2004-11-05
TAKAGI, YASUYUKI
Executed: 2004-11-05
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Ion Beam Apparatus, Ion Beam Processing Method and Sample Holder Member
Patent: 6,838,685 →
Application: 10/629,217 →
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →