IP Library Assignment 015992/0717
Patent Assignment
Reel/Frame 015992/0717

Assignment of Assignor's Interest

Recorded: 2004-11-16 Pages: 2
Assignors
WATANABE, KENJI
Executed: 2004-10-18
OTAKA, TADASHI
Executed: 2004-10-18
NAKAGAKI, RYO
Executed: 2004-10-21
SHISHIDO, CHIE
Executed: 2004-10-22
TAKAHASHI, MASAKAZU
Executed: 2004-10-19
TOYOSHIMA, YUUA
Executed: 2004-10-29
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Sample Dimension-Measuring Method and Charged Particle Beam Apparatus
Patent: 7,476,856 →
Application: 10/875,509 →
Publication: US 2005/0051721
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →