IP Library Assignment 015992/0911
Patent Assignment
Reel/Frame 015992/0911

Assignment of Assignor's Interest

Recorded: 2004-11-18 Pages: 2
Assignors
KITAJIMA, ITARU
Executed: 2004-10-12
WATANABE, KAZUTOSHI
Executed: 2004-10-12
WAKIYAMA, SHIGERU
Executed: 2004-10-12
YASUTAKE, MASATOSHI
Executed: 2004-10-12
INOUE, AKIRA
Executed: 2004-10-12
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Scanning Probe Microscope and Scanning Method
Patent: 7,373,806 →
Application: 10/925,049 →
Publication: US 2005/0050947
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →