IP Library › Assignment 016077/0202
Patent Assignment
Reel/Frame 016077/0202

Assignment of Assignor's Interest

Recorded: 2004-12-08 Pages: 2
Assignors
OKUDA, HIROHITO
Executed: 2004-05-27
TAKAGI, YUJI
Executed: 2004-06-14
HONDA, TOSHIFUMI
Executed: 2004-05-27
MIYAMOTO, ATSUSHI
Executed: 2004-06-14
HIRAI, TAKEHIRO
Executed: 2004-05-27
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Apparatus and Method for Classifying Defects Using Multiple Classification Modules
Patent: 7,873,205 →
Application: 10/809,464 →
Publication: US 2004/0252878
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →