Assignment of Assignor's Interest

Recorded: 2004-12-23 Pages: 3

Assignors

KAITO, TAKASHI

Executed: 2004-11-12

YASUTAKE, MASATOSHI

Executed: 2004-11-12

ADACHI, TATSUYA

Executed: 2004-11-12

Assignee

SII NANOTECHNOLOGY INC.

8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN

Covered Property (1)

Probe for Scanning Probe Microscope

Patent: 6,864,481 →

Application: 10/308,796 →

Publication: US 2003/0122072

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.