Patent Assignment
Reel/Frame 016117/0542
Assignment of Assignor's Interest
Recorded: 2004-12-21
Pages: 2
Assignee
HATACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Patterned Wafer Inspection Method and Apparatus Therefor
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.