IP Library › Assignment 016122/0557
Patent Assignment
Reel/Frame 016122/0557

Assignment of Assignor's Interest

Recorded: 2004-12-22 Pages: 2
Assignors
FURUKAWA, TAKASHI
Executed: 2004-11-15
MIZUNO, TAKAYUKI
Executed: 2004-11-16
HAZAKI, EIICHI
Executed: 2004-11-29
SATO, HIROFUMI
Executed: 2004-11-30
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU TOKYO, JAPAN
Covered Property (1)
Probe Navigation Method and Device and Defect Inspection Device
Patent: 7,071,713 →
Application: 11/018,356 →
Publication: US 2005/0140379
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →