IP Library Assignment 016187/0511
Patent Assignment
Reel/Frame 016187/0511

Assignment of Assignor's Interest

Recorded: 2005-05-02 Pages: 3
Assignors
PARK, GYEONG-SU
Executed: 2005-01-11
KAJI, KAZUTOSHI
Executed: 2005-01-18
PARK, JONG-BONG
Executed: 2005-01-11
TERADA, SHOHEI
Executed: 2005-01-17
HIRANO, TATSUMI
Executed: 2005-01-17
SONG, SE-AHN
Executed: 2005-01-11
Assignees
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
HITACHI, LTD.
4-6 KANDA-SURUGADAI, CHIYODA-KU, TOKYO, JAPAN
HITACHI HIGH-TECHNOLOGIES CO.
24-14 NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Standard Sample for Transmission Electron Microscope (Tem) Elemental Mapping and Tem Elemetal Mapping Method Using the Same
Patent: 7,053,372 →
Application: 11/034,721 →
Publication: US 2005/0184233
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →