Patent Assignment
Reel/Frame 016250/0069
Assignment of Assignor's Interest
Recorded: 2005-02-02
Pages: 3
Assignors
CHEN, XINFEN
Executed: 2005-01-21
WU, XIAOJU
Executed: 2005-01-27
ARCH, JOHN K.
Executed: 2005-01-27
WANG, QINGFENG
Executed: 2005-01-25
Assignee
TEXAS INTRUMENTS INCORPORATED
P.O. BOX 655474, MS 3999, DALLAS, TEXAS, 75265
Covered Property
(1)
Method for Detecting Epitaxial (Epi) Induced Buried Layer Shifts in Semiconductor Devices