Patent Assignment
Reel/Frame 016252/0779
Assignment of Assignor's Interest
Recorded: 2005-02-14
Pages: 4
Assignors
GRAMANN, WOLFGANG
Executed: 2002-05-27
OBERSCHMID, RAIMUND
Executed: 2002-05-27
SPATH, WERNER
Executed: 2002-06-24
TEICH, WOLFGANG
Executed: 2002-05-27
Assignee
OSRAM OPTO SEMICONDUCTORS GMBH & CO. OHG.
WERNERWERKSTRASSE 2, REGENSBURG, 93049, GERMANY
Covered Property
(1)
Method for Measuring Product Parameters of Components Formed on a Wafer and Device for Performing the Method
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.