IP Library › Assignment 016341/0435
Patent Assignment
Reel/Frame 016341/0435

Assignment of Assignor's Interest

Recorded: 2005-03-08 Pages: 2
Assignors
HAZAKI, EIICHI
Executed: 2004-11-30
MITSUI, YASUHIRO
Executed: 2004-11-30
FURUKAWA, TAKASHI
Executed: 2004-12-08
YANAGITA, HIROSHI
Executed: 2004-12-10
KATO, SUSUMU
Executed: 2004-11-30
SATOU, OSAMU
Executed: 2004-11-30
YAMADA, OSAMU
Executed: 2004-12-02
INADA, YOSHIKAZU
Executed: 2004-11-30
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defective Product Inspection Apparatus, Probe Positioning Method and Probe Moving Method
Patent: 7,297,945 →
Application: 11/002,710 →
Publication: US 2005/0139781
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →