Patent Assignment
Reel/Frame 016413/0932
Assignment of Assignor's Interest
Recorded: 2005-04-01
Pages: 2
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Scanning Probe Microscopy System and Method of Measurement by the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.