IP Library › Assignment 016447/0753
Patent Assignment
Reel/Frame 016447/0753

Assignment of Assignor's Interest

Recorded: 2005-04-08 Pages: 2
Assignors
IKEDA, SATOSHI
Executed: 2005-03-25
KAWADA, HIROKI
Executed: 2005-03-15
KOBARU, ATSUSHI
Executed: 2005-03-15
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method of Measurement Accuracy Improvement by Control of Pattern Shrinkage
Patent: 7,045,782 →
Application: 11/009,393 →
Publication: US 2005/0161602
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →