Patent Assignment
Reel/Frame 016451/0829
Assignment of Assignor's Interest
Recorded: 2005-04-12
Pages: 3
Assignors
WATANABE, KENJI
Executed: 2005-03-03
SATAKE, TOHRU
Executed: 2005-03-03
NOJI, NOBUHARU
Executed: 2005-03-03
MURAKAMI, TAKESHI
Executed: 2005-03-03
KARIMATA, TSUTOMU
Executed: 2005-03-03
YAMAZAKI, YUICHIRO
Executed: 2005-03-03
NAGAHAMA, ICHIROTA
Executed: 2005-03-03
ONISHI, ATSUSHI
Executed: 2005-03-03
Assignees
EBARA CORPORATION
11-1, HANEDA ASAHI-CHO, OHTA-KU, TOKYO, JAPAN
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Electron Beam Apparatus with Detailed Observation Function and Sample Inspecting and Observing Method Using Electron Beam Apparatus
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 11, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043546/0955 →
Change of Name
Dec 23, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 058573/0535 →
Merger
Dec 23, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 058573/0542 →
Change of Name
Dec 23, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058573/0657 →