Patent Assignment
Reel/Frame 043546/0955
Assignment of Assignor's Interest
Recorded: 2017-09-11
Pages: 6
Assignor
KABUSHIKI KAISHA TOSHIBA
Executed: 2017-08-29
Assignee
TOSHIBA MEMORY CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Properties
(38)
Apparatus and Method for Polishing Workpiece
Patent:
6,354,918 →
Application:
09/335,778 →
Semiconductor Element and Fabricating Method Thereof
Patent:
6,569,752 →
Application:
09/522,820 →
Polishing Method and Apparatus
Patent:
6,667,238 →
Application:
09/545,504 →
Polishing Apparatus
Patent:
6,413,154 →
Application:
09/582,845 →
Polishing Apparatus
Patent:
6,645,053 →
Application:
09/622,638 →
Polishing Apparatus
Patent:
6,634,924 →
Application:
09/669,883 →
Detecting Apparatus and Device Manufacturing Method
Substrate Processing Apparatus
Mapping-Projection-Type Electron Beam Apparatus for Inspecting Sample by Using Electrons Reflected from the Sample
Substrate Processing Apparatus
Electron Beam Apparatus with Detailed Observation Function and Sample Inspecting and Observing Method Using Electron Beam Apparatus
Electron Beam Apparatus and Device Manufacturing Method Using Same
Electron Beam Inspection System and Inspection Method and Method of Manufacturing Devices Using the System
Detecting Apparatus and Device Manufacturing Method
Polishing Apparatus and Polishing Method
Electron Beam Apparatus with Detailed Observation Function and Sample Inspecting and Observing Method Using Electron Beam Apparatus
Polishing apparatus and polishing method
Electron Beam Apparatus and an Aberration Correction Optical Apparatus
Inspection System by Charged Particle Beam and Method of Manufacturing Devices Using the System
Substrate Processing Method and Substrate Processing Apparatus
Apparatus and Method for Inspecting Sample Surface
Substrate Holding Mechanism, Substrate Polishing Apparatus and Substrate Polishing Method
Inspection System by Charged Particle Beam and Method of Manufacturing Devices Using the System
Polishing Apparatus and Polishing Method
Processing end point detection method, polishing method,and polishing apparatus
Method and Apparatus for Charged Particle Beam Inspection
Substrate Surface Inspection Method and Inspection Apparatus
Mapping-Projection-Type Electron Beam Apparatus for Inspecting Sample by Using Electrons Emitted from the Sample
Substrate Holding Mechanism, Substrate Polishing Apparatus and Substrate Polishing Method
Polishing Apparatus and Polishing Method
Substrate Polishing Apparatus
Polishing Endpoint Detection Apparatus
Method for Manufacturing Semiconductor Device
Polishing Apparatus and Polishing Method
Inspection System by Charged Particle Beam and Method of Manufacturing Devices Using the System
Inspection System by Charged Particle Beam and Method of Manufacturing Devices Using the System
Processing End Point Detection Method, Polishing Method, and Polishing Apparatus
Polishing Endpoint Detection Method
Related Assignments
(23)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 15, 1999
From: TOGAWA, TETSUJI; TAKADA, NOBUYUKI; KATSUOKA, SEIJI; SHIGETA, KENICHI
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 010239/0519 →
Assignment of Assignor's Interest
Mar 10, 2000
From: HOMMA, SOICHI; MIYATA, MASAHIRO; EZAWA, HIROKAZU; YOSHIOKA, JUNICHIRO
To: KABUSHIKI KAISHA TOSHIBA; EBARA CORPORATION
Reel/Frame 010620/0775 →
Assignment of Assignor's Interest
Sep 11, 2000
From: TOGAWA, TETSUJI; SAKURAI, TAKESHI; TAKADA, NOBUYUKI; KODAMA, SHOICHI
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 011110/0863 →
Assignment of Assignor's Interest
Nov 8, 2000
From: KIMURA, NORIO; ISHII, YOU; TATEYAMA, YOSHIKUNI
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 011276/0912 →
Assignment of Assignor's Interest
Dec 1, 2000
From: ONO, KOJI; OGURI, SHOZO; SASABE, KENICHI; KURITA, MASATO
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 011345/0120 →
Assignment of Assignor's Interest
Nov 19, 2002
From: HATAKEYAMA, MASAHIRO; MURAKAMI, TAKESHI; SATAKE, TOHRU; NOJI, NOBUHARU
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 013505/0458 →
Assignment of Assignor's Interest
Jan 23, 2003
From: KIMURA, NORIO; SHIRAKASHI,MITSUHIKO; TOKUSHIGE, KATSUHIKO; ASAMI, MASAO
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 013687/0400 →
Assignment of Assignor's Interest
Jul 11, 2003
From: ISHII, YOU; NAKANISHI, MASAYUKI; NAKAMURA, KENRO
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 014264/0040 →
Assignment of Assignor's Interest
Jan 28, 2004
From: NAKANISHI, MASAYUKI; ISHII, YOU; NAKAMURA, KENRO
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 014928/0009 →
Assignment of Assignor's Interest
Apr 12, 2005
From: WATANABE, KENJI; SATAKE, TOHRU; NOJI, NOBUHARU; MURAKAMI, TAKESHI
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 016451/0829 →
Assignment of Assignor's Interest
Apr 18, 2006
From: WATANABE, KENJI; MURAKAMI, TAKESHI; HATAKEYAMA, MASAHIRO; HIRABAYASHI, YOSHINAO
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 017795/0219 →
Assignment of Assignor's Interest
Apr 10, 2007
From: KUBOTA, TAKEO; SHIGETA, ATSUSHI; TOYOTA, GEN; TAKAHASHI, TAMAMI
To: KABUSHIKI KAISHA TOSHIBA; EBARA CORPORATION
Reel/Frame 019191/0075 →
Assignment of Assignor's Interest
May 14, 2007
From: TADA, MITSUO; TAKAHASHI, TARO; NIIJIMA, MOTOHIRO; OHTA, SHINRO
To: EBARA CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 019321/0541 →
Assignment of Assignor's Interest
Aug 1, 2007
From: HATAKEYAMA, MASAHIRO; MURAKAMI, TAKESHI; NOJI, NOBUHARU; NAKASUJI, MAMORU
To: EBARA CORPORATION
Reel/Frame 019629/0922 →
Assignment of Assignor's Interest
Jan 22, 2009
From: HATAKAYAMA, MASAHIRO; MURAKAMI, TAKESHI; NOJI, NOBUHARU; NAKASUJI, MAMORU
To: EBARA CORPORATION
Reel/Frame 022138/0371 →
Assignment of Assignor's Interest
Jan 23, 2009
From: EBARA CORPORATION
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 022148/0609 →
Merger
Aug 30, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K.PANGEA
Reel/Frame 057353/0184 →
Change of Name
Sep 13, 2021
From: K.K.PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057582/0829 →
Change of Name
Sep 29, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057686/0287 →
Change of Name
Dec 23, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058573/0657 →
Merger
Dec 23, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 058573/0542 →
Change of Name
Dec 23, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 058573/0535 →
Assignment of Assignor's Interest
Jun 27, 2022
From: KIOXIA CORPORATION
To: EBARA CORPORATION
Reel/Frame 060320/0169 →