Patent Assignment
Reel/Frame 016560/0982
Assignment of Assignor's Interest
Recorded: 2005-05-11
Pages: 2
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Scanning Probe Microscope and Measuring Method by Means of the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.