IP Library Assignment 016642/0832
Patent Assignment
Reel/Frame 016642/0832

Assignment of Assignor's Interest

Recorded: 2005-05-31 Pages: 2
Assignors
AGEMURA, TOSHIHIDE
Executed: 2005-05-18
SATO, MITSUGU
Executed: 2005-05-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection and Charged Particle Beam Apparatus
Patent: 7,112,792 →
Application: 11/139,609 →
Publication: US 2005/0263702
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →