Patent Assignment
Reel/Frame 016703/0654
Assignment of Assignor's Interest
Recorded: 2005-06-17
Pages: 2
Assignors
IYOKI, MASATO
Executed: 2005-02-22
HIDAKA, AKIHIKO
Executed: 2005-02-22
WATANABE, KAZUTOSHI
Executed: 2005-02-22
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Fine-Adjustment Mechanism for Scanning Probe Microscopy
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.