IP Library Assignment 016729/0059
Patent Assignment
Reel/Frame 016729/0059

Assignment of Assignor's Interest

Recorded: 2005-06-24 Pages: 2
Assignors
MIZUNO, TAKESHI
Executed: 2005-05-30
KAWADA, HIROKI
Executed: 2005-05-30
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Scanning Electron Microscope and Cd Measurement Calibration Standard Specimen
Patent: 7,361,898 →
Application: 11/165,223 →
Publication: US 2005/0285035
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →