IP Library › Assignment 016802/0721
Patent Assignment
Reel/Frame 016802/0721

Assignment of Assignor's Interest

Recorded: 2005-07-21 Pages: 2
Assignors
YAMAGUCHI, ATSUKO
Executed: 2005-05-27
FUKUDA, HIROSHI
Executed: 2005-05-30
KAWADA, HIROKI
Executed: 2005-05-25
MAEDA, TATSUYA
Executed: 2005-05-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Evaluation Method of Fine Pattern Feature, Its Equipment, and Method of Semiconductor Device Fabrication
Patent: 7,366,620 →
Application: 11/185,852 →
Publication: US 2006/0036409
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →