Patent Assignment
Reel/Frame 016815/0553
Assignment of Assignor's Interest
Recorded: 2005-09-19
Pages: 3
Assignor
TAKAOKA, OSAMU
Executed: 2005-08-22
Assignee
SII NANO TECHNOLOGY INC.
8 NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method of Correcting Amplitude Defect in Multilayer Film of Euvl Mask
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.