IP Library › Assignment 016817/0438
Patent Assignment
Reel/Frame 016817/0438

Assignment of Assignor's Interest

Recorded: 2005-07-27 Pages: 2
Assignors
TANAKA, MAKI
Executed: 2005-06-22
MIYAMOTO, ATSUSHI
Executed: 2005-06-28
MOROKUMA, HIDETOSHI
Executed: 2005-06-22
SHISHIDO, CHIE
Executed: 2005-06-23
IKEDA, MITSUJI
Executed: 2005-06-22
TOYODA, YASUTAKA
Executed: 2005-06-27
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Measuring Three-Dimensional Shape of Specimen by Using Sem
Patent: 7,230,243 →
Application: 11/156,478 →
Publication: US 2005/0285034
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →