Patent Assignment
Reel/Frame 016820/0755
Assignment of Assignor's Interest
Recorded: 2005-08-01
Pages: 3
Assignors
YAMAOKA, TAKEHIRO
Executed: 2005-06-03
WATANABE, KAZAUTOSHI
Executed: 2005-06-03
ANDO, KAZUNORI
Executed: 2005-06-03
SHIRAKAWABE, YOSHIHARU
Executed: 2005-06-03
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU. CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Scanning Probe Microscope and Operation Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.