Patent Assignment
Reel/Frame 016822/0391
Assignment of Assignor's Interest
Recorded: 2005-07-27
Pages: 2
Assignor
MATSUI, MIYAKO
Executed: 2005-06-06
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Apparatus for Inspecting Semiconductor Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.