IP Library Assignment 016823/0827
Patent Assignment
Reel/Frame 016823/0827

Assignment of Assignor's Interest

Recorded: 2005-07-27 Pages: 2
Assignors
TSUNETA, RURIKO
Executed: 2005-06-21
INADA, HIROMI
Executed: 2005-06-22
KOGUCHI, MASANARI
Executed: 2005-06-21
HASHIMOTO, TAKAHITO
Executed: 2005-06-22
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Electric Charged Particle Beam Microscopy, Electric Charged Particle Beam Microscope, Critical Dimension Measurement and Critical Dimension Measurement System
Patent: 7,372,051 →
Application: 11/189,897 →
Publication: US 2006/0038125
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →