IP Library › Assignment 016837/0924
Patent Assignment
Reel/Frame 016837/0924

Assignment of Assignor's Interest

Recorded: 2005-09-22 Pages: 3
Assignors
TAKAHASHI, HIROYUKI
Executed: 2005-07-28
NAKAGAWA, ATSUSHI
Executed: 2005-07-28
KERA, TAKUYA
Executed: 2005-07-28
MIYATA, MASAKI
Executed: 2005-07-28
KAWAGUCHI, YASUNARI
Executed: 2005-07-28
GOTOU, KOUICHI
Executed: 2005-07-28
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Semiconductor Memory Device, Test Circuit and Test Method
Patent: 7,652,943 →
Application: 11/205,194 →
Publication: US 2006/0039220
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 11, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025346/0886 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →