Patent Assignment
Reel/Frame 025346/0886
Change of Name
Recorded: 2010-11-11
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Spread Spectrum Clock Generator
Modular-multiplication computing unit and information-processing unit
Application:
11/176,222 →
Publication:
US 2006/0008081
Semiconductor Device for Passive Rfid, Ic Tag, and Control Method Thereof
Electric Potential Switching Circuit, Flash Memory with Electric Potential Switching Circuit, and Method of Switching Electric Potential
Nonvolatile Semiconductor Memory and Method for Setting Replacement Information in Nonvolatile Semiconductor Memory
Semiconductor Device and Method for Manufacturing Same
Semiconductor device and method of manufacturing the same
Application:
11/180,675 →
Publication:
US 2006/0017090
Semiconductor Device
Bonding Method and Bonding Apparatus
System and Method for Designing and Manufacturing Lsi
Semiconductor Device and Method of Fabricating the Same
Copper Interconnection and the Method for Fabricating the Same
Method for Manufacturing a Semiconductor Device
Semiconductor Device
Semiconductor Device
Narrow and Wide Copper Interconnections Composed of (111),(200) and (511) Surfaces
Resin-Molded Package with Cavity Structure
Copy Protection Method and System for Programmable Gate Array
Pdp Data Driver, Pdp Driving Method, Plasma Display Device, and Control Method for the Same
Floating-Gate Non-Volatile Memory Architecture for Improved Negative Bias Distribution
Semiconductor Device for Ic Tag, Ic Tag and Control Method for Ic Tag for Detecting and Executing Command from Radio Wave
Reader/writer for transmitting command to IC tag, communication method and communication system based thereon
Application:
11/190,973 →
Publication:
US 2006/0022798
Semiconductor Device for Ic Tag, Ic Tag, and Control Method for Ic Tag for Detecting and Executing Command from Radio Wave
Vertical Field Effect Transistor
Semiconductor Device
Liquid crystal display device and driver circuit therefor
Application:
11/192,365 →
Publication:
US 2006/0022929
Power-On Clear Circuit
Semiconductor Device, Method and Apparatus for Testing Same, and Method for Manufacturing Semiconductor Device
Semiconductor Storage Device and Method of Manufacturing Same
Sample/Hold Apparatus with Small-Sized Capacitor and Its Driving Method
Semiconductor Device
LCD apparatus for improved inversion drive
Application:
11/198,843 →
Publication:
US 2006/0028426
Semiconductor Memory Device and Manufacturing Method Thereof
Semiconductor Storage Device and Method of Manufacturing the Same
Semiconductor Memory Device
Signal Detecting Circuit
Internal Voltage Level Control Circuit and Semiconductor Memory Device as Well as Method of Controlling the Same
Semiconductor Device and Manufacturing Method of the Same
Voltage Supply Circuit and Microphone Unit Comprising the Same
Semiconductor Device and Electronic Apparatus Using the Same
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Device
C-Shaped Dummy Gate Electrode Semiconductor Device and Method of Manufacturing the Same
Semiconductor Memory Device, Test Circuit and Test Method
Semiconductor Device
Clock Generating Circuit
Visual Inspection Method and Visual Inspection Apparatus
Method for Manufacturing Semiconductor Device
Flip-Chip Semiconductor Device Utilizing an Elongated Tip Bump
Temperature Detection Circuit
Grayscale Voltage Generating Circuit and Method
Clock Buffer Circuit Having Predetermined Gain with Bias Circuit Thereof
Semiconductor Device
Fuse Trimming Circuit
Signal Determining Apparatus Including Amplifier Circuit with Variable Response Speed
A Package Substrate for a Semiconductor Device Having Thermoplastic Resin Layers and Conductive Patterns
A/D Converter and Duty Control Method of Sampling Clock
Semiconductor Circuit Device and Method of Detecting Runaway
Method and Apparatus for Sampling a Power Supply Current of an Integrated Circuit, and Storage Medium Onto Which Is Recorded a Control Program Therefor
Semiconductor Device with Termination Resistance Adjusting Circuit
Semiconductor Device Mounting Structure for Reducing Thermal Stress and Warpage
Laser Beam Processing Apparatus for Processing Semiconductor Wafer in Production of Semiconductor Devices, Laser Beam Processing Method Executed Therein, and Such Semiconductor Wafer Processed Thereby
Synchronization Device and Semiconductor Device
Voltage Comparator Circuit
Semiconductor Device
Semiconductor Device and Method for Manufacturing Same
Clock and Data Recovery Circuit
Charger and Integrated Circuit Having First and Second Charging Currents
Method for Manufacturing Field Effect Transistor
Semiconductor Device
Semiconductor Device
Nitride Based Semiconductor Light-Emitting Device
Printed Circuit Board Having Colored Outer Layer
Vertical MOSFET
Application:
11/234,245 →
Publication:
US 2006/0065925
Semiconductor Device Having Projection on Surface Thereof, and Method of Identifying Semiconductor Package
Resin Molded Semiconductor Device and Mold
Mobile Station Capable of Channel Estimation Using Substantial Single Antenna at Path Switching, Channel Estimating Apparatus and Its Receiving Method
Differential Output Circuit for Improving Bandwidth
Semiconductor Device and Manufacturing Method Thereof
Semiconductor Device, Wafer and Method of Designing and Manufacturing the Same
Decoding Apparatus and Decoding Method
Semiconductor Device
Method and Measurement Program for Burn-in Test of Two Semiconductor Devices Simultaneously
Simulation System and Computer Program
Semiconductor Integrated Circuit and Burn-in Test Method Thereof
Trace Controller, Microprocessor, and Trace Control Method
Comparator Circuit with Offset Control
Integrated Circuit Device
Data Communication Apparatus with Intermittent Activation Control Circuit
Output Buffer Circuit and Semiconductor Device
Memory Test Circuit and Method
Semiconductor Device and Method of Fabricating the Same
Related Assignments
(16)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 8, 2005
From: HIGASHI, KUNIHIKO; HISAKADO, TORU; GOTO, SATOSHI; IKENAGA, TAKESHI
To: NEC ELECTRONICS CORPORATION; WASEDA UNIVERSITY
Reel/Frame 016766/0151 →
Assignment of Assignor's Interest
Jul 12, 2005
From: SUGAWARA, HIROSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016772/0061 →
Assignment of Assignor's Interest
Jul 14, 2005
From: KIKUCHI, KATSUMI; YAMAMICHI, SHINTARO; MURAI, HIDEYA; HONDA, HIROKAZU
To: NEC CORPORATION; NEC ELECTRONICS CORPORATION
Reel/Frame 016780/0505 →
Assignment of Assignor's Interest
Jul 14, 2005
From: FUKUMAKI, NAOMI; KATO, YOSHITAKE; INOUE, KEN
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016779/0445 →
Assignment of Assignor's Interest
Jul 19, 2005
From: SODA, EIICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016789/0594 →
Assignment of Assignor's Interest
Jul 19, 2005
From: HIROI, MASAYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016788/0588 →
Assignment of Assignor's Interest
Jul 20, 2005
From: IGUCHI, MANABU; TAKEWAKI, TOSHIYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016798/0891 →
Assignment of Assignor's Interest
Jul 21, 2005
From: TAKEWAKI, TOSHIYUKI; KUNISHIMA, HIROYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016802/0235 →
Assignment of Assignor's Interest
Jul 22, 2005
From: TONAMI, MASAHIRO; NAKAMURA, KOZABURO; KONDO, ATSUSHI; FUNAKI, SHIGEAKI
To: NEC ELECTRONICS CORPORATION; MIKASA SHOJI CO., LTD.
Reel/Frame 016805/0911 →
Assignment of Assignor's Interest
Aug 12, 2005
From: WATANUKI, SHINICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016636/0201 →
Assignment of Assignor's Interest
Aug 23, 2005
From: KONISHI, SHINYA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016658/0507 →
Assignment of Assignor's Interest
Aug 29, 2005
From: YONEDA, SATOSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016677/0511 →
Assignment of Assignor's Interest
Nov 12, 2007
From: FENG, TA-MIN; MISHRA, STEVE S.
To: TREMCO INCORPORATED
Reel/Frame 020095/0499 →
Assignment of Assignor's Interest
Jun 11, 2010
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024524/0463 →
Assignment of Assignor's Interest
Jul 12, 2013
From: NEC CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 030783/0873 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →