Patent Assignment
Reel/Frame 016879/0076
Assignment of Assignor's Interest
Recorded: 2005-10-13
Pages: 3
Assignor
BARTOV, AVISHAY
Executed: 2004-05-02
Assignee
APPLIED MATERIALS, ISRAEL, LTD.
9 OPPENHEIMER, REHOVOT, ISRAEL
Covered Property
(1)
System and Method for Measuring Thin Film Thickness Variations and for Compensating for the Variations