Patent Assignment
Reel/Frame 016930/0011
Assignment of Assignor's Interest
Recorded: 2005-08-30
Pages: 3
Assignors
SHIRAWAWABE, YOSHIHARU
Executed: 2005-07-06
TAKAHASHI, HIROSHI
Executed: 2005-07-06
ARAI, TADASHI
Executed: 2005-07-06
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method of Manufacturing the Multi-Tip Probe, a Multi-Tip Probe, and Surface Characteristic Analysis Apparatus
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.