IP Library › Assignment 016962/0757
Patent Assignment
Reel/Frame 016962/0757

Assignment of Assignor's Interest

Recorded: 2005-09-07 Pages: 2
Assignors
TERUI, TAAUSHI
Executed: 2005-08-25
OKUMOTO, TOYOHARU
Executed: 2005-08-25
SHISHIKA, TSUKASA
Executed: 2005-08-25
NAGAI, SHINJI
Executed: 2005-08-25
TOMIOKA, MASARU
Executed: 2005-08-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHIMBASHI MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Ion Trap/Time-of-Flight Mass Analyzing Apparatus and Mass Analyzing Method
Patent: 7,186,973 →
Application: 11/149,263 →
Publication: US 2005/0279926
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →