IP Library Assignment 016979/0111
Patent Assignment
Reel/Frame 016979/0111

Assignment of Assignor's Interest

Recorded: 2005-11-03 Pages: 3
Assignor
AOKI, YOSHIYUKI
Executed: 2005-09-13
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Memory Test Circuit and Method
Patent: 7,526,697 →
Application: 11/242,059 →
Publication: US 2006/0085711
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 11, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025346/0886 →