IP Library Assignment 017026/0329
Patent Assignment
Reel/Frame 017026/0329

Assignment of Assignor's Interest

Recorded: 2005-08-23 Pages: 3
Assignors
NOJIMA, SHIGEKI
Executed: 2005-06-08
TANAKA, SATOSHI
Executed: 2005-06-08
KOTANI, TOSHIYA
Executed: 2005-06-26
IZUHA, KYOKO
Executed: 2005-06-18
INOUE, SOICHI
Executed: 2005-07-25
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO 105-8001, JAPAN
Covered Property (1)
Pattern Data Correction Method, Pattern Checking Method, Pattern Check Program, Photo Mask Producing Method, and Semiconductor Device Manufacturing Method
Patent: 7,788,626 →
Application: 11/138,407 →
Publication: US 2005/0273754
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
Change of Name and Address Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
Merger Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →