Patent Assignment
Reel/Frame 017036/0230
Re-Record to Correct Assignee's Address Previously Recorded on Reel 016391 Frame 0104.
Recorded: 2005-09-27
Pages: 4
Assignee
KABUSHIKI KAISHA TOSHIBA
72, HORIKAWA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA-KEN, JAPAN
Covered Property
(1)
Semiconductor Device Analyzer, Method for Analyzing/Manufacturing Semiconductor Device, and Storage Medium Storing Program for Analyzing Semiconductor Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.