Patent Assignment
Reel/Frame 017037/0868
Assignment of Assignor's Interest
Recorded: 2005-09-28
Pages: 2
Assignor
SASAKI, SUGURU
Executed: 2005-09-21
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Method and Measurement Program for Burn-in Test of Two Semiconductor Devices Simultaneously
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.