Patent Assignment
Reel/Frame 017103/0412
Assignment of Assignor's Interest
Recorded: 2005-10-20
Pages: 3
Assignors
SAITO, YUIKA
Executed: 2005-10-14
MURAKAMI, TAKASHI
Executed: 2005-10-14
KAWATA, SATOSHI
Executed: 2005-10-14
INOUE, YASUSHI
Executed: 2005-10-14
TSUKAGOSHI, KAZUHITO
Executed: 2005-10-14
IYOKI, MASATO
Executed: 2005-10-14
Assignees
RIKEN
2-1, HIROSAWA, WAKO-SHI, SAITAMA, JAPAN
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN
Covered Property
(1)
Probe for Near-Field Microscope, the Method for Manufacturing the Probe and Scanning Probe Microscope Using the Probe
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.