Assignment of Assignor's Interest

Recorded: 2005-10-19 Pages: 2

Assignor

KIM, OOK HYUN

Executed: 2005-10-18

Assignee

DONGBUANAM SEMICONDUCTOR INC.

891-10, DAECHI-DONG, KANGNAM-GU, SEOUL, 135-280, KOREA, REPUBLIC OF

Covered Property (1)

Wafer edge exposure method in semiconductor photolithographic processes, and orientation flatness detecting system provided with a WEE apparatus

Application: 11/254,296 →

Publication: US 2007/0085988

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.