Patent Assignment
Reel/Frame 017141/0414
Assignment of Assignor's Interest
Recorded: 2005-10-26
Pages: 2
Assignors
OHSHIMA, YOSHIMASA
Executed: 2005-08-29
NOGUCHI, MINORI
Executed: 2005-08-29
NAKANO, HIROYUKI
Executed: 2005-08-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Apparatus for Detecting Defects